Pilot Platform  | Tool & Feature Selection 

Non-Explosive Environment | Tool FoV |  Microscopy | Raman Splitter | Probe Dimension

Microscopy Field of View Options

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Milli | 4.4mm dia. Field of View

Micro | 900µm dia. Field of View

Meso+ | 400µm dia. Field of View

Meso | 230µm dia. Field of View


​The BlazeMilli is under development & currently not available for shipment.


230µm dia. Field of View

Predominantly particles < 30µm measure change to 70µm

  • 400 nanometer Resolution

  • 133 nanometer detection

  • 7.78 pixels/µm Resolution 

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400µm dia. Field of View 

Predominantly particles < 60µm

measure change to 130µm

  • 600 nanometer Resolution​

  • 200 nanometer Detection

  • 5 pixels/µm Resolution 

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900µm dia. Field of View 

Predominantly particles < 330um measure change to 660µm

  • <1µm Resolution

  • 400 nanometer Detection

  • 2.15 pixels/µm Resolution

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4.4mm dia. Field of View 

Predominantly particles < 1.4mm  measure change to 2.2mm

  • <6µm Resolution

  • 4µm Detection

  • 4.6 pixels/10µm Resolution

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Note on Resolution Target Comparisons: It is typical for the microscope industry to utilize reference targets such as the 1951 AF Standard Target above to compare 2d resolution. For more information, please contact Blaze and/or visit: https://en.wikipedia.org/wiki/1951_USAF_resolution_test_chart

Please contact Blaze for an introduction to 3D resolution, which is a critical parameter for most PAT applications.

See our Technology page on Microscopy for further detail:

1M Microscopy 

1M Laser Classification:  Considered non-hazardous. First generation Blaze Microscopy tools are rated 1M. Hazard increases if viewed with optical aids, including magnifiers, binoculars, or telescopes.

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3B Microscopy 

3B laser classification: Typical Raman systems are rated Class 3B. 3B indicates immediate skin hazard from direct beam and immediate eye hazard when viewed directly. The advantage of High Power 3B Illumination for Microscopy is the ability to see fainter particles.








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NOTE:  Due to Raman inclusion, Blaze Platforms are typically rated 3B. In some cases, 532nm excited Raman is sufficient for an application, and a Blaze 1M for both Microscopy and 532nm excited Raman can be provided.

*Spectrometers are required. They may be supplied via Blaze, directly from the Spectrometer Manufacture, or a pre-existing system at the user site. Spectroscopy systems are not created equal, please contact Blaze for optical match (Blaze-Spectrometer compatibility) and both hardware and software connectivity information for your spectrometer choice.

Simultaneous 532 & 785 nm Excited Raman or Manual Swap (532 OR 785 nm) Raman*​

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785 nm 

532 nm 

The grey arrows represent the Raman signal fiber optic connection(s) between the BlazeMetrics enclosure and the respective spectrometer(s).

The Splitter Option is Blaze hardware that allows for a 785nm Spectrometer and a 532nm Spectrometer to be attached at the same time. A system that does not have a Splitter only allows a 785nm Spectrometer OR a 532nm Spectrometer.

See our Technology page on Raman for further detail:

BlazeMicro PG Polarization

Enables simultaneous acquisition of multi-angle, particle generated polarized light images. See our technology page on Polarization to learn more:

BlazeMicro NO PG Polarization 

Standard dark field microscopy.


Detachable/Interchangeable Probe Options

The conduit disconnects at the enclosure for Pilot Production systems. The enclosure can then be used with a different probe & conduit. NOTE: The probe that is no longer connected to an enclosure but still in a reactor must be considered for temp, pressure, & material compatibility for anything running in that reactor.

630 mm Immersible

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47mm section also submersible for all Pilot Tools

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820 mm Immersible

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820 mm Immersible

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400 mm Immersible


Field of View for Second Probe

PG Polarization for Second Probe

To learn more click here

Receive customized details on your chosen configuration

If you do not know which configuration is best for you, inquire below and we will reach out for further discussion!

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